History

A history of ultra performance.

A legacy of ultra innovation.

Below is a brief glimpse of Celadon’s product innovations and industry firsts.


1997


1998


1999


2000


2001


2002


2003


2005


2006


2007


2008


2009


2010


2011

  • Developed dual site 40mm parametric test probe card
  • Awarded government research grant for high density multi-site wafer level reliability

2012

  • Introduced Element Series VC20 probe card for fast card changes in parametric test, modeling and characterization, and wafer level reliability testing.

Copyright © 2013 Celadon Systems, Inc.