History

chip card

A history of ultra performance.

A legacy of ultra innovation.

Below is a brief glimpse of Celadon’s product innovations and industry firsts.


1997

  • Celadon is founded by Bryan Root on February 15th
  • First adjustable multi-site ceramic probe card on a 3 x 3 platform

1998

  • First low leakage ceramic probe card with operating temp range of -65 to 300C
  • First multi-site ceramic probe card with operating temp range of -65 to 300C
  • First low cost production ceramic probe card with self-aligning,
    quickly replaceable individual probes
  • 72mm ceramic probe card

1999

  • 114mm ceramic probe card
  • 200mm ceramic probe card

2000

  • T200 ButtonTile™ 200mm ceramic probe card

2001

  • First 200mm “dead bug” probe card aligner
  • T40™ ceramic probe card

2002

  • First 300°C operating temperature coaxial probe – AttoFast™

2003

  • T300 ButtonTile™ 300mm multi-site ceramic probe card

2005

  • First 500°C ceramic probe card
  • MiniTile™ probe

2006

  • VersaTile™ ceramic probe card

2007

  • VersAdjust™
  • T90™ multi-site ceramic probe card

2008

  • First 300mm “dead bug” probe card aligner

2009

  • VersaCore™ – first easy insertion twist lock probe card core

2010

  • Introduced the 1×3 VersaTile™ multi-site probe card for 4.5″ probe card holders

2011

  • Developed dual site 40mm parametric test probe card
  • Awarded government research grant for high density multi-site wafer level reliability

2012

  • Introduced Element Series VC20 probe card for fast card changes in parametric test, modeling and characterization, and wafer level reliability testing.

2013

  • Introduction of the Indexer™ – the industry’s first automatic probe card changer using the VC20™ probe cards.

2014

  • VC43™ 100 pin channel modular probe card supporting 100 pin Parametric Testers

2015

  • First cabled-out (triaxial and coaxial cables) VC20™ interface released

2016

  • Diagnostic Probe Cards based on the VC20™ footprint
  • More products to come this year!