Patents & Intellectual Property
Celadon Systems, Inc.’s business, products, and processes are protected by U.S. and International patents and pending U.S. and International patent applications. The issued patents include:
- US No. 6,201,402 13-Mar-2001
PROBE TILE AND PLATFORM FOR LARGE AREA WAFER PROBING
- JP No. 3,287,800 15-Mar-2002
PROBE TILE AND PLATFORM FOR DETAILED INSPECTION OF WAFER HAVING LARGE AREA
- US No. 6,586,954 1-Jul-2003
PROBE TILE FOR PROBING SEMICONDUCTOR WAFER
- US No. 7,786,743 31-Aug-2010
PROBE TILE FOR PROBING SEMICONDUCTOR WAFER
- TW No. I318300 11-Dec-2009
SHIELDED PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER
- US No. 7,768,282 3-Aug-2010
APPARATUS AND METHOD FOR TERMINATING PROBE APPARATUS OF SEMICONDUCTOR WAFER
- US No. 7,728,609 1-Jun-2010
REPLACEABLE PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER
- US No. 7,659,737 9-Feb-2010
ELECTRICAL HIGH TEMPERATURE TEST PROBE WITH CONDUCTIVE DRIVEN GUARD
- US No. 7,626,404 1-Dec-2009
REPLACEABLE PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER
- US No. 7,545,157 9-Jun-2009
SHIELDED PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER
- CN No. 03152461.3 22-Apr-2009
SHIELDED PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER
- US No. 7,345,494 18-Mar-2008
PROBE TILE FOR PROBING SEMICONDUCTOR WAFER
- US No. 7,271,607 18-Sep-2007
ELECTRICAL HIGH TEMPERATURE TEST PROBE WITH CONDUCTIVE DRIVEN GUARD
- US No. 7,259,577 21-Aug-2007
SHIELDED PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER
- US No. 7,170,305 30-Jan-2007
APPARATUS AND METHOD FOR TERMINATING PROBE APPARATUS OF SEMICONDUCTOR WAFER
- US No. 7,148,710 12-Dec-2006
PROBE TILE FOR PROBING SEMICONDUCTOR WAFER
- US No. 6,992,495 31-Jan-2006
SHIELDED PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER
- US No. 6,975,128 13-Dec-2005
ELECTRICAL HIGH TEMPERATURE TEST PROBE WITH CONDUCTIVE DRIVEN GUARD
- US No. 6,963,207 8-Nov-2005
APPARATUS AND METHOD FOR TERMINATING PROBE APPARATUS OF SEMICONDUCTOR WAFER
- US No. 6,882,168 19-Apr-2005
PROBE TILE FOR PROBING SEMICONDUCTOR WAFER
- TW No. I226096 1-Jan-2005
PROBE PLATFORM AND METHOD FOR ELECTRICALLY PROBING SEMICONDUCTOR WAFERS
- TW No. 204761 11-Jun-2004
APPARATUS AND METHOD FOR TERMINATING PROBE APPARATUS OF SEMICONDUCTOR WAFER
- US No. 8,149,009 3-Apr-2012
APPARATUS AND METHOD FOR TERMINATING PROBE APPARATUS OF SEMICONDUCTOR WAFER
- US No. 8,354,856 5-Feb-2013
REPLACEABLE PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER
