Patents & IP

form factor

Celadon Systems, Inc.’s business, products, and processes are protected by U.S. and International patents and pending U.S. and International patent applications. The issued patents include:


US     6201402      13-Mar-2001
PROBE TILE AND PLATFORM FOR LARGE AREA WAFER PROBING


JP     3287800      15-Mar-2002
PROBE TILE AND PLATFORM FOR LARGE AREA WAFER PROBING


US     6586954     01-Jul-2003
PROBE TILE AND PLATFORM FOR LARGE AREA WAFER PROBING


TW     204761     11-Jun-2004
APPARATUS AND METHOD FOR TERMINATING PROBE APPARATUS OF SEMICONDUCTOR WAFER


TW     I226096     01-Jan-2005
PROBE PLATFORM AND METHOD FOR ELECTRICALLY PROBING SEMICONDUCTOR WAFERS


US     6882168     19-Apr-2005
PROBE TILE FOR PROBING SEMICONDUCTOR WAFER


US     6963207     8-Nov-2005
APPARATUS AND METHOD FOR TERMINATING PROBE APPARATUS OF SEMICONDUCTOR WAFER


US     6975128     13-Dec-2005
ELECTRICAL, HIGH TEMPERATURE TEST PROBE WITH CONDUCTIVE DRIVEN GUARD


US     6992495     31-Jan-2006
SHIELDED PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER


US     7148710     12-Dec-2006
PROBE TILE FOR PROBING SEMICONDUCTOR WAFER


US     7170305     30-Jan-2007
APPARATUS AND METHOD FOR TERMINATING PROBE APPARATUS OF SEMICONDUCTOR WAFER


US     7259577     21-Aug-2007
SHIELDED PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER


US     7271607     18-Sep-2007
ELECTRICAL, HIGH TEMPERATURE TEST PROBE WITH CONDUCTIVE DRIVEN GUARD


US     7345494     18-Mar-2008
PROBE TILE FOR PROBING SEMICONDUCTOR WAFER


CN     03152461.3     22-Apr-2009
SHIELDED PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER


US     7545157      09-Jun-2009
SHIELDED PROBE APPARATUS FOR PROBING SEMINCONDUCTOR WAFER


US     7626404     01-Dec-2009
REPLACEABLE PROBE APPARATUS FOR PROBING SEMICONDUCTOR
WAFER


TW     I318300     11-Dec-2009
SHIELDED PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER


US     7659737     09-Feb-2010
ELECTRICAL, HIGH TEMPERATURE TEST PROBE WITH CONDUCTIVE DRIVEN GUARD


US     7728609     01-Jun-2010
REPLACEABLE PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER


TW     I327226     11-Jul-2010
SHIELDED PROBE APPARATUS


EM     001225460-0002     19-Jul-2010
TOP CONTACT LAYOUT FOR A MOTHERBOARD IN AN ELECTRICAL SYSTEM


EM     001225460-0001     19-Jul-2010
GROOVED WIRE SUPPORT FOR A PROBE TEST CORE


US     7768282     03-Aug-2010
APPARATUS AND METHOD FOR TERMINATING PROBE APPARATUS OF SEMICONDUCTOR WAFER


US     7786743     31-Aug-2010
PROBE TILE FOR PROBING SEMICONDUCTOR WAFER


CN     200580034397.5     01-Jun-2011
REPLACEABLE PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER


US     7956629     07-Jun-2011
PROBE TILE FOR PROBING SEMICONDUCTOR WAFER


US     D639755     14-Jun-2011
TOP CONTACT LAYOUT FOR A MOTHERBOARD IN AN ELECTRICAL SYSTEM


US     D639757     14-Jun-2011
TOP CONTACT LAYOUT BOARD IN AN ELECTRICAL SYSTEM


US     7999564     16-Aug-2011
REPLACEABLE PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER


US     D654033     14-Feb-2012
GROOVED WIRE SUPPORT FOR A PROBE TEST CORE


US     8149009     03-Apr-2012
APPARATUS AND METHOD FOR TERMINATING PROBE APPARATUS OF SEMICONDUCTOR WAFER


CN     200810214776.8     20-Jun-2012
REPLACEABLE PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER


US     8354856     15-Jan-2013
REPLACEABLE PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER


TW     I391689     01-Apr-2013
REPLACEABLE PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER


TW     I408374     11-Sep-2013
APPARATUS AND METHOD FOR TERMINATING PROBE APPARATUS OF SEMICONDUCTOR WAFER


US     8674715     18-Mar-2014
TEST APPARATUS HAVING A PROBE CORE WITH A TWIST LOCK MECHANISM


TW     I431281     21-Mar-2014
REPLACEABLE PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER


CN     201110099921.4     02-Apr-2014
REPLACEABLE PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER


US     8698515     15-Apr-2014
PROBE TEST EQUIPMENT FOR TESTING A SEMICONDUCTOR DEVICE


US     D713363     16-Sep-2014
SUPPORT FOR A PROBE TEST CORE


US     8860450     14-Oct-2014
APPARATUS AND METHOD FOR TERMINATING PROBE APPARATUS OF SEMICONDUCTOR WAFER


US     D722031     03-Feb-2015
TOP CONTACT LAYOUT BOARD IN AN ELECTRICAL SYSTEM


US     8994390     31-Mar-2015
TEST SYSTEMS WITH A PROBE APPARATUS AND INDEX MECHANISM


US     9018966     28-Apr-2015
TEST APPARATUS HAVING A PROBE CARD AND CONNECTOR MECHANISM


US     9024651     05-May-2015
TEST APPARATUS HAVING A PROBE CARD AND CONNECTOR MECHANISM


CN     201280039075.X     15-Jul-2015
TEST APPARATUS HAVING A PROBE CARD AND CONNECTOR MECHANISM


TW     I503551     11-Oct-2015
APPARATUS AND METHOD FOR TERMINATING PROBE APPARATUS OF SEMICONDUCTOR WAFER


US     9279829     08-Mar-2016
APPARATUS AND METHOD FOR TERMINATING PROBE APPARATUS OF SEMICONDUCTOR WAFER


CN     201280042127.9     06-Jul-2016
TEST APPARATUS HAVING A PROBE CARD AND CONNECTOR MECHANISM