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Single Site Probe Cards (T40)
The 40 mm tile was designed for mounting on a standard 4.5” Probe card holder. The 1.6 mm (0.062") thick rails allow the chassis to slip into a probe card holders for most analytical probe stations. High temperature cables (Low noise coax on the T40AF and T40LL) are compatible with -65 to 300°C continuous operation. The connection to triaxial cable harnesses is made through connectors mounted away from the hot wafer chuck area. Celadon has designed cable interface kits that are directly compatible with a variety of commercially available test systems and probe stations.
40 Millimeter Ceramic Tile Single Site Probe Cards
- Optimized for DC parametric test and single site WLR
- Compatible with standard 4.5” rectangular edge card holders
- Temperature compensated for use from-65°C to +300°C
- fA level leakage measurements
- Compatible with quick disconnect triaxial cable harnesses
- Quasi-Kelvin connections available
- Several Connector options Available
| P/N | Parametric Style | Leakage Fempto Amps per Volt | Settling time in seconds | Settling Time | Pin to pin Leakage in Fempto Amps per volt | Probe Replacement | Probe Type | Maximum Number of Probes | Minimum Sustained Operating Temperature | Maximum Sustained Operating Temperature | Ownership Cost | Suggested Cable/Connector Method | Recommended Prober Size | Typical Applications |
| T40AF | AttofastTM | 1 fA/V | 1 | Ultra Fast | 1 at 1 second | Requires Factory Trained Person with Aligner | Coax - two conductor | 36 | -65°C | 300°C | Medium | Triax | 150 mm and Above | Modelling, Device Characterization, Applications for fast wafer stepping to collect high accuracy data |
| T40LL | Low Leakage | 5 fA/V | 10 | Fast | 5 at 10 seconds | Requires Factory Trained Person with Aligner | Single Conductor | 50 | -65°C | 300°C | Low | Triax | 150 mm and Above | Modelling, Device Characterization |
| T40HT | Functional Test and High Temperature Test | Less than one 1 pA/V | 10 | Not specified | Not Specified | Requires Factory Trained Person with Aligner | Single Conductor | 100 | -65°C | 300°C | Low | Coax, Single Conductor, Ribbon or Plain Wire | 150 mm and Above | Functional Test, High Temperature Test |
- Mounting Method: 4.5" Probe Card Holder
- Temperature Compensated? YES
- Supports Multi-Site Probing No/ Not applicable
- Maximum Coverage Area: 28 mm
- Crash Resistance: Rigid and Fault Tolerant, Slots protect probe from Damage
- Probe Self Alignment Slots Yes - cavity captured
- Die to Die Pitch Does not apply