T200 ButtonTile™ & T300 ButtonTile™

The Celadon T200™/T300™ probe cards are designed for long-term, multi-site, high-density wafer level reliability tests up to 400°C. In today’s economic environment, conventional reliability data is needed quickly while eliminating the cost, electrical stress, and delay of parts packaging  while maintaining a wafer performance map.

T200 ButtonTile™ 

• 200 millimeter ceramic button probe card
• Optimized for multi-site WLR
• For use with the Celadon Modular Adapter™
• Temperature compensated for use from -65°C to 300°C (options to 400°C)
• fA level leakage measurements
• Compatible with quick disconnect Celadon triax cable harnesses
• Quasi-Kelvin connections available
• Several Connector options available

T300™ ButtonTile 

• 300 millimeter ceramic button probe card
• Optimized for multi-site WLR
• For use with the Celadon Modular Adapter™
• Temperature compensated for use from -65°C to 300°C (options to 400°C)
• fA level leakage measurements
• Compatible with quick disconnect Celadon triax cable harnesses
• Quasi-Kelvin connections available
• Several Connector options available