T40AF

The T40™ series is the #1 probe card in the world for modeling and characterization. The probes are mounted in a precisely fabricated ceramic substrate to provide self-alignment and allow space for controlled over-travel crash resistance. The AF model minimizes settling time using AttoFast™ technology.

• <1fA/V pin to pin leakage in 1 sec. @ 20°C
• <10fA/V pin to pin leakage @ 300°C
• <60F stray capacitance
• -65°C to 300°C operating temperature
• Ultra stable
• Crash resistant
• Uses a low noise coax pigtail