T40LL & T40HT

The 40 mm tile was designed for mounting on a standard 4.5” Probe card holder, and is ideal for wafer level reliability testing. The rails allow the chassis to slip into probe card holders for most analytical probe stations.

• 40 millimeter ceramic probe card
• Optimized for DC parametric test and single site WLR
• Compatible with standard 4.5” rectangular edge card holders
• Temperature compensated for use from-65°C to 300°C
• fA level leakage measurements
• Compatible with quick disconnect triaxial cable harnesses
• Quasi-Kelvin connections available
• Several connector options available