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VC20E Series Probe Card

The 20mm VC20 is a highly adaptable probe card solution for a wide variety of tests including Modeling & Characterization, Wafer Level Reliability or Parametric Test. It can be easily combined with different interfaces to create modular probe cards supporting Keithley, Keysight or other custom tester platforms.

  • 20 millimeter ceramic probe card
  • Optimized for DC parametric test, modeling and characterization, and single site WLR
  • Can be quickly installed using an interface tool into various interfaces and takes minimal storage space on the test floor
  • Effective operating temperature range from -65° to 200° C
  • Leakage as low as 5fA/V
  • Can be configured with up to 48 probes
  • Probes can be configured in either single or dual layer
  • Standard X/Y accuracy 10% pad size
  • Standard Z accuracy +/- 5 microns

Download Data Sheet

Interested in Production Parametric Probe?

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Indexer™

The patented Indexer™ is the industry’s first automatic probe card changer designed for lights out parametric test.

  • Can support up to five VC20’s, any variety
  • Card changes are complete in seconds
  • Fully programmable
  • Tested for hundreds of thousands of touchdowns.

Download Data Sheet

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Diagnostic VersaCore™

The diagnostic cores are uniquely designed in the VC20™ format. Using the customizable PCB, components can be added to create a “golden core” to quickly troubleshoot your system

  • Test SMUs
  • Test Motherboard
  • Test Pogo pins
  • Test Relay matrix

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VC43™

The 43mm VC43™ is a highly adaptable probe card solution for a wide variety of tests including Modeling & Characterization, Wafer Level Reliability or Parametric Test.  It can be easily combined with different interfaces to create a modular probe card supporting higher pin count tester platforms like the V93000 and P9000.

  • 43 millimeter ceramic probe card
  • Optimized for DC parametric test, modeling and characterization, and single site WLR
  • Can be quickly installed using an interface tool into various interfaces and takes minimal storage space on the test floor
  • Effective operating temperature range from -65° to 200°C
  • Leakage as low as 5fA/V
  • Can be configured with up to 100 probes
  • Probes can be configured in either single or dual layer
  • Repairable

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T40 Series Probe Card

Ultra low noise and fast settling modeling and characterization tests are made possible by Celadon’s patented ceramic probe cards.

T40LL, T40HT, T40AF, T40LLIC, T40AFIC

The 40 mm tile was designed for mounting on a standard 4.5″ probe card holder. The 1.6 mm (0.062″) thick rails allow the chassis to slip into planarity adjustable probe card holders for most analytical probe stations.

  • 40 millimeter ceramic probe card
  • Optimized for DC parametric test and single site WLR
  • Compatible with standard 4.5″ rectangular edge card holders
  • Temperature compensated for use from-65°C to 300°C
  • Extended temperature option to 600°C
  • Sub-fA level leakage measurements available
  • Compatible with quick disconnect triaxial cable harnesses
  • Quasi-Kelvin connections available
  • Several connector options available

Download Data Sheet

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Minitile™ and WedgeTile™

Each probe is designed for wide temperature ranges and so the probe expansion characteristics are closely matched to the wafer’s expansion characteristics. This allows the user to take a fast measurement while a system is in a settling or thermal stabilization mode and helps compensate for wafer expansion.

  • Rigid ceramic and metal chassis
  • Integrated cable strain reliefs
  • -65°C to 300°C operating temperature ranges
  • 1 to 25 pins per site
  • Available in regular low leakage (5 femto amps per volt)
  • AttoFast™ with guarded tips for 2 femto amp per volt settling time
  • High accuracy capacitance measurements
  • Low probe to probe capacitance for high accuracy CV measurements and for device characterization and modeling

Download Data Sheet

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T90™ Series Probe Card

The 90 mm tile was designed for mounting on a standard 4.5″ probe card holder for multi-site wafer level reliability testing. The 1.6 mm (0.062″) thick rails allow the chassis to slip into planarity adjustable probe card holders for most analytical probe stations.

  • 90 millimeter ceramic probe card
  • Optimized for multi-site DC parametric test and multi-site WLR
  • Compatible with standard 4.5″ rectangular edge card holders
  • Temperature compensated for use from -65°C to 300°C
  • fA level leakage measurements
  • Compatible with quick disconnect Celadon triax cable harnesses
  • Quasi-Kelvin connections available
  • Several Connector options available

Download Data Sheet

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Patch Panels

For maximum channel flexibility, Celadon can design and build custom patch panels to meet your WLR requirements.

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VersaTile™ and VersaAdjust™

Celadon has reduced the size of a probe card to 28mm with the VersaTile™. The VersaTile™ can fit on a conventional 3-hole mount probe positioner for single site probing. The same VersaTile™ can be used in a 300mm VersaPlate™ for multi-site probing.

  • Optimized for DC parametric test and WLR
  • Temperature compensated for use from -65°C to 300°C
  • fA/V level leakage measurements
  • Compatible with quick disconnect Celadon triax cable harnesses
  • Quasi-Kelvin connections available
  • Several Connector options available

Download Data Sheet

If interested in a fully-integrated high-throughput test cell for wafer-level reliability (WLR), the Cascade Microtech ESTRADA system using Celadon probe cards may be a good fit for your testing needs.”  Click here to learn more. 

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Cryogenic VersaTile™

Space and other Cryogenic applications are a challenge with testing down to 7 Kelvin. Celadon’s Cryogenic VersaTile™ is a stable, proven probe card compatible with most probe stations including Cascade Microtech’s Cryogenic probe station. Click here for more information

This probe card has all of the benefits of the patented Crash Resistant Technology™ but with the ability to probe down to absolute cold.

Please contact the factory at 952-232-1700 for more information.

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High Performance Cables and Accessories

Quietest cables in the Industry. Get the most out of your probe card.

Cables are designed and manufactured by Celadon. Cables are available in lengths custom to the half-meter, and can be manufactured with a variety of industry standard connectors, such as coaxial, triaxial, Type8, Edge 24/48 or 35/70, DSub 9, 15, 25, or 50; or advanced multi-contact. Depending on the overall size of the final product, an anti-abrasion sheath may be used to prevent wire wear.

  • Low noise/low triboelectric effect
  • Low leakage/isolation between signal and guard
  • Low guard to shield capacitance/minimize load on guard amp
  • Strong to minimize damage/should be clamped or held
  • All cable systems are manufactured to perform to the highest standards of ultra-low noise so that you can obtain the most accurate results possible.

Download Data Sheet

Light Tight Enclosure

The Celadon Octagon Light Tight Enclosure surrounds the probe card to guarantee maximum low-level current monitoring performance.

  • Removable side panels allow for customization of the cabling connection.
  • 25-pin AMP connectors allow quick connect and disconnect of the low leakage driven guard channels
  • A removable lid completes the light tight design

Modular Adapters

Rigid and stable probe card holder for T200™, T300™, and VersaTile™/VersaPlate™. Also Compatible with T40™, T90™, and special probe cards. Temperature Stable to 400°C. Three point planarity adjustment. Compatible with the Cascade Elite, Accretech UF3000, TEL P12, and other probers. Also designed for high Z force multi-site probing applications.

Modular Adaptor Ring

  • High stability
  • Designed for correct probe card heights
  • Allows use of full range of Celadon ceramic probe cards such as T40™, T90™, T200™ and T300™
  • Has insert rings to hold various types of Celadon probe cards, which allows for rapid probe card changes
  • Theta change does not cause x-y shift, reducing setup time via central axis pivot action
  • Transportable from one prober to another with personality rings
  • Allows probe stations to use high pin count probe cards due to superior strength and rigidity (prober requires chuck with minimal tilt for given applied Z force)
  • Designed for thermal probing applications with materials that will hold up to wide temperature variations
  • Has high Z force planarity adjustments required by multi-site probe cards
  • Allows probe cards to be rotated so if wafer orientation changes, you do not have to purchase another probe card

Aetrium Package Interface

  • Turns any Aetrium package tester into a wafer level or package tester
  • Interface boards available for all Aetrium application modules

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T300 ButtonTile™ Multisite Probe Card

The Celadon T300™ probe cards are designed for long-term, multi-site, high-density wafer level reliability or burn-in tests up to 400°C. In today’s economic environment, conventional reliability data is needed quickly while eliminating the cost, electrical stress, and delay of parts packaging while maintaining a wafer performance map.

  • 300 millimeter ceramic button probe card
  • Optimized for multi-site WLR
  • For use with the Celadon Modular Adapter™
  • Temperature compensated for use from -65°C to 350°C (options to 400°C)
  • fA level leakage measurements

 

Download Data Sheet

 

If interested in a fully-integrated high-throughput test cell for wafer-level reliability (WLR), the Cascade Microtech ESTRADA system using Celadon probe cards may be a good fit for your testing needs.”  Click here to learn more. 

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Tile-on-Card™

The Celadon Tile-on-Card probe card is a low cost solution for lower temperature or ambient Device Testing, Modeling & Characterization or Wafer Level Reliability.

  • Has all of the benefits of the Celadon patented Crash Resistant Ceramic Technology
  • Is known for very low maintenance, having a long life resulting in a low cost of ownership
  • Can support multi-die testing up to 200 probes
  • Can support various tester platform

Download Data Sheet

Have a question? Need additional information?

Please call or email us:

Phone: 952-232-1700