Celadon Systems, Inc.

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Light Tight Enclosure


Shown is the new LTE (Light Tight Enclosure) with VersaTileTM system in a Celadon Modular AdapterTM. The red knobs shown allow easy planarization to the sub 10 micron level for the probe card. The probe card is surrounded by a light tight enclosure (LTE) which guarantees maximum low-level current monitoring performance. Removable side panels of the octagon LTE allow for customization of the cabling connection. In the above photos, two 25-pin AMP connectors allow quick connect and disconnect of the low leakage driven guard channels. A removable lid shown in the middle photo completes the light tight design.

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  • Have you ever tried to probe a wafer only to have light effect the measurements and repeatability?
  • Have you ever had measurements and reliability data changed day to day due to humidity?
  • Have you ever moved a cable in a way such that the probe card was damaged or moved on the wafer and damaged it?
  • Have you ever had the need to change the sex of a cable on an interface box while keeping cable length to a minimum?
  • Do you hneed a way to keep cables from probes to interace kept to a minimum length?
  • Do you need a way to keep the gas such as nitrogen on your pads to keep the wafer pads from oxidizing
  • Have you ever had stray fields from motors, lights, power converters, test instruments cause strange unrepeatable measurements due to noise and field problems?
  • Do you have problems with capacitance measurement repeatability when using probe cards?

light-tight-enclosure3.jpgThese are the problems that this product solves in an Elegant machined metal enclosure with cover and replaceable side walls.

  • Available for leading analytical and autoprober manufacturers
  • Provide Light Tight E/M Shielding for wafer from the platen to Microscope area.
  • Provide Enivronmental Enclosure so Nitrogen or Dry Air can be kept in probing environment while Multi-Site probing takes place.
  • Provide Enclosure for Positive Pressure Nitrogen Environment to prevent wafer oxidation at temperature.
  • Bring out cables from probe card to interface panel through shield while providing solid cable anchor and strain relief system.