Each probe is designed for wide temperature ranges and so the probe expansion characteristics are closely matched to the wafer’s expansion characteristics. This allows the user to take a fast measurement while a system is in a settling or thermal stabilization mode and helps compensate for wafer expansion.
Rigid ceramic and metal chassis
Integrated cable strain reliefs
-65°C to 300°C operating temperature ranges
1 to 25 pins per site
Available in regular low leakage (5 femto amps per volt)
AttoFast™ with guarded tips for 2 femto amp per volt settling time
High accuracy capacitance measurements
Low probe to probe capacitance for high accuracy CV measurements and for device characterization and modeling
Celadon produces probe cards and probing solutions for modeling & characterization, parametric test, and wafer level reliability for the semiconductor industry that thrive in any temperature extremes while still delivering accurate and precise test results.