The 40 mm tile was designed for mounting on a standard 4.5” probe card holder. The 1.6 mm (0.062″) thick rails allow the chassis to slip into planarity adjustable probe card holders for most analytical probe stations.
40 millimeter ceramic probe card
Optimized for DC parametric test and single site WLR
Compatible with standard 4.5” rectangular edge card holders
Temperature compensated for use from-65°C to 300°C
Extended temperature option to 600°C
fA level leakage measurements
Compatible with quick disconnect triaxial cable harnesses
Celadon produces probe cards and probing solutions for modeling & characterization, parametric test, and wafer level reliability for the semiconductor industry that thrive in any temperature extremes while still delivering accurate and precise test results.