T300 Series
300 Millimeter Celadon Ceramic Button Tile Multi-Site Site Probe Cards
- Optimized for Multi-Site WLR
- Compatible with the Celadon Modular AdapterTM
- Temperature compensated for use from-65°C to +300°C
- fA level leakage measurements
- Compatible with quick disconnect triaxial cable harnesses
- Quasi-Kelvin connections available
- Several Connector options Available
| P/N | Parametric Style | Leakage Fempto Amps per Volt | Settling time in seconds | Settling Time | Probe Replacement | Probe Type | Maximum Number of Probes | Minimum Sustained Operating Temperature | Maximum Sustained Operating Temperature | Ownership Cost | Suggested Cable/Connector Method | Recommended Prober Size | Typical Applications |
| T300LL | Low Leakage | 5 fA/V | 10 | Fast | Requires Factory Trained Person with Aligner | Single Conductor | 5000 | -65°C | 300°C | Low | Triax | 300mm | Modeling, Device Characterization, Wafer Level Reliability (WLR), Hot Carriers (HCI), Negative Bias Temperature Instability (NBTI), Time Dependent Dielectric Breakdown (TDDB), Bias Temperature Stress (BTS) |
| T300HT | Functional Test and High Temperature Test | Less than one 1 pA/V | 10 | Not specified | Requires Factory Trained Person with Aligner | Single Conductor | 5000 | -65°C | 300°C | Low | Coax, Single Conductor, Ribbon or Plain Wire | 300mm | Functional Test, High Temperature Test, Wafer Level Reliability (WLR), Electromigration (EM) |
| T300SP | Special Purpose | Less than one 1 pA/V | Depends on Application | Not specified | Requires Factory Trained Person with Aligner | Single Conductor | 5000 | -65°C | 300°C | Low | Mezzinine Board | 300mm | Wafer Level burn in. Device Test. Life Test. Specialty Tests. |
- Mounting Method: Celadon Modular AdapterTM
- Temperature Compensated: Yes
- Supports Multi-Site Probing: Yes
- Maximum Coverage Area: Round 280mm Diameter
- Crash Resistance: Rigid and Fault Tolerant, Slots protect probe from Damage
- Probe Self Alignment Slots: Yes - cavity captured
- Die to Die Pitch: Depends on Design call for details
Probe Station
- Requires properly configured Probe Station.
- Compatible with many popular models.
- Contact Celadon for additional information
- The microscope needs to move across the wafer while the wafer chuck remains stationary or an upward looking stage mounted camera with probe to pad alignment needs to be used.
- High Z force chucks may be required- dependent on number of probes.
- Chuck needs to be well planarized and flat.
Required Accessories
- Celadon Modular Adapter
- Establish web connection to this page
- Touch Down Sensor Box
- Accessory - establish web connection to this page
Suggested Celadon Cables: CBL001-3m, CBL501-3m
Recommended Accessory: Octagon Light Tight Enclosure and Interface Panel, Accessory - establish web connection to this page.
Notes: This product is typically used with reliability systems from leading manufacturers and switching matrices connected to parameter analyzers.
