Parametric Test

Twist. Lock. Test.

Celadon’s VC40 parametric test probe card is the lowest-cost-per-touchdown probe card for the Keithley S600 and Agilent 407x/408x series testers. Learn more…

Cores can be easily changed out of motherboards using the simple twist and lock mechanism.

The new Element Series is based on the 20mm VC20 probe card, which can be used for production parametric test, as well as modeling and characterization, and wafer level reliability testing. Learn more…

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