Celadon Systems, Inc.

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VersaTile™ On 3 Hole Probe Mount

Celadon has reduced the size of a probe card down so that it will fit on a conventional 3-hole mount probe positioner. You can switch from RF to DC test using the same probe holder. And the design does not compromise performance. With a Celadon approved positioner gives you stable probing at +300°C is possible on entire test patterns for low level DC characterization. This is also a great solution for Multi-Site wafer level reliability. On magnetic stands, the positioner can be readily moved to accommodate changes in wafer die pitch. Positioners are available with X, Y, Z, planarity, and theta adjust. Multi-Site adjustable pitch WLR is now a reality at an affordable price.

  • Optimized for DC parametric test and single site WLR
  • Compatible with Celadon Approved Rigid Probe Arms
  • Temperature compensated for use from-65°C to +300°C
  • fA level leakage measurements
  • Compatible with quick disconnect triaxial cable harnesses
  • Quasi-Kelvin connections available
  • Several Connector options Available
P/N Parametric Style Leakage Fempto Amps per Volt Settling time in seconds Settling Time Pin to pin Leakage in Fempto Amps per volt Probe Replacement Probe Type Probe Card Wiring Maximum Number of Probes Minimum Sustained Operating Temperature Maximum Sustained Operating Temperature Ownership Cost Suggested Cable/Connector Method Recommended Prober Size Typical Applications
TV19LL Low Leakage 5 fA/V 10 Fast 5 at 10 seconds Requires Factory Trained Person with Aligner Single Conductor Coax
 25 -65°C 300°C Medium Coax or Triax 150 mm and Above Modeling, Device Characterization, Applications for fast wafer stepping to collect high accuracy data
TV19HT Functional Test and High Temperature Test Less than one 1 pA/V 10 Not specified Not Specified Requires Factory Trained Person with Aligner Single Conductor Single Conductor
 50 -65°C 300°C Low Coax or Triax 150 mm and Above Modeling, Device Characterization
TV19LC Functional Test and High Temperature Test Less than one 1 pA/V 10 Not specified Not Specified Requires Factory Trained Person with Aligner Single Conductor Direct Probe to PCB Connection
 100 -65°C 300°C Low Coax, Single Conductor, Ribbon or Plain Wire 150 mm and Above Functional Test, High Temperature Test
TV22LL
 Low Leakage
 5fA/V
 10
 Fast
 5 at 10 seconds Requires Factory Trained Person with Aligner Single Conductor Coax
 25
 -65°C 300°C Medium
 Coax or Triax 150 mm and Above Modeling, Device Characterization, Applications for fast wafer stepping to collect high accuracy data
TV22HT
 Functional Test and High Temperature Test
 Less than one 1pA/V
 10
 Not Specified Not Specified Requires Factory Trained Person with Aligner Single Conductor Single Conductor 50
 -65°C 300°C Low Coax or Triax 150 mm and Above Modeling, Device Characterization
TV22LC
 Functional Test and High Temperature Test Less than one 1 pA/V
 10
 Not Specified Not Specified Requires Factory Trained Person with Aligner Single Conductor Direct Probe to PCB Connection 100
 -65°C 300°C Low Coax, Single Conductor, Ribbon or Plain Wire 150 mm and Above Functional Test, High Temperature Test

  • Mounting Method: Probe arm, or VersaPlateTM
  • Temperature Compensated? YES
  • Supports Multi-Site Probing: No/ Not applicable
  • Maximum Coverage Area: 28 mm
  • Crash Resistance: Rigid and Fault Tolerant, Slots protect probe from Damage
  • Probe Self Alignment Slots: Yes - cavity captured
  • Die to Die Pitch: Does not apply

The Celadon VersaTileTM got its name because the product is easily reconfigurable and field installable for many different probing applications. This allows users to maintain the same probe for many different applications such as WLR, Functional Test and Parametric test. Up to 16 VersaTilesTM can be installed in a Celadon Probe Card Holder called a Celadon Modular AdapterTM. Up to 8 VersaTilesTM can be used in positioner mounted applications. The main benefit of the product for analytical lab users who have probers that switch between positioner and probe card holder setups is that it allows most probing to be done on the positioner based setup reducing setup time, therefore saving time, and improving equipment utilization.