One simple probe card. Diverse probing applications.
The Element Series from Celadon makes semiconductor testing for modeling and characterization, production parametric test, and wafer level reliability easier than ever before by allowing the user to test with the same probe card in a variety of prober interfaces.
The VC20 probe card can be configured with up to 48 probes despite being the diameter of a coin. Learn more…
Celadon produces probe cards and probing solutions for modeling & characterization, parametric test, and wafer level reliability for the semiconductor industry that thrive in any temperature extremes while still delivering accurate and precise test results.