The Element Series
One simple probe card. Diverse probing applications.
The Element Series from Celadon makes semiconductor testing for modeling and characterization, production parametric test, and wafer level reliability easier than ever before by allowing the user to test with the same probe card in a variety of prober interfaces.
The VC20 probe card can be configured with up to 48 probes despite being the diameter of a coin. Learn more…
The 45E interface converts the VC20 probe card into an industry-standard 4.5″ probe card. Learn more…
The 4080E transforms the VC20 into a production parametric test probe card for the Agilent series 407x/408x series testers. Learn more…
