4080E

4080E

what is a parametric test

4080E

The Element Series 4080E converts a VC20 probe card into a production parametric test probe card for Agilent 407x/408x series testers.


  • Quickly lock probe cards into place
  • Leave the 4080E in the tester during card changes
  • Effective operating temperature range from -65° to 200° C
  • Leakage as low as 5fA/V
  • Can be configured with up to 48 probes
  • Probes can be configured in either single or dual layer
  • Minimum pitch 50µm
  • Standard X/Y accuracy 10% pad size
  • Standard Z accuracy +/- 5 microns