4080E
4080E
The Element Series 4080E converts a VC20 probe card into a production parametric test probe card for Agilent 407x/408x series testers.
- Quickly lock probe cards into place
- Leave the 4080E in the tester during card changes
- Effective operating temperature range from -65° to 200° C
- Leakage as low as 5fA/V
- Can be configured with up to 48 probes
- Probes can be configured in either single or dual layer
- Minimum pitch 50µm
- Standard X/Y accuracy 10% pad size
- Standard Z accuracy +/- 5 microns
