T200 & T300 ButtonTile™ Probe Cards

The Celadon T200™/T300™ probe cards are designed for long-term, multi-site, high-density wafer level reliability tests up to 400°C. In today’s economic environment, conventional reliability data is needed quickly while eliminating the cost, electrical stress, and delay of parts packaging  while maintaining a wafer performance map.


T200 ButtonTile™ 

T300™ ButtonTile 

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