T200 & T300 ButtonTile™ Probe Cards

T200 & T300 ButtonTile™ Probe Cards

chip card technologyThe Celadon T200™/T300™ probe cards are designed for long-term, multi-site, high-density wafer level reliability tests up to 400°C. In today’s economic environment, conventional reliability data is needed quickly while eliminating the cost, electrical stress, and delay of parts packaging  while maintaining a wafer performance map.


T200 ButtonTile™ 

  • 200 millimeter ceramic button probe card
  • Optimized for multi-site WLR
  • For use with the Celadon Modular Adapter™
  • Temperature compensated for use from -65°C to 300°C (options to 400°C)
  • fA level leakage measurements
  • Compatible with quick disconnect Celadon triax cable harnesses
  • Quasi-Kelvin connections available
  • Several Connector options available

T300™ ButtonTile 

  • 300 millimeter ceramic button probe card
  • Optimized for multi-site WLR
  • For use with the Celadon Modular Adapter™
  • Temperature compensated for use from -65°C to 300°C (options to 400°C)
  • fA level leakage measurements
  • Compatible with quick disconnect Celadon triax cable harnesses
  • Quasi-Kelvin connections available
  • Several Connector options available