The 90 mm tile was designed for mounting on a standard 4.5” probe card holder for multi-site wafer level reliability testing. The 1.6 mm (0.062″) thick rails allow the chassis to slip into planarity adjustable probe card holders for most analytical probe stations.
90 millimeter ceramic probe card
Optimized for multi-site DC parametric test and multi-site WLR
Compatible with standard 4.5” rectangular edge card holders
Temperature compensated for use from -65°C to 300°C
fA level leakage measurements
Compatible with quick disconnect Celadon triax cable harnesses
Celadon produces probe cards and probing solutions for modeling & characterization, parametric test, and wafer level reliability for the semiconductor industry that thrive in any temperature extremes while still delivering accurate and precise test results.