Celadon has reduced the size of a probe card down so that it will fit on a conventional 3-hole mount probe positioner. You can switch from RF to DC test using the same probe holder. The design does not compromise performance, and is easily adjustable for a variety of wafer level reliability applications.
Optimized for DC parametric test and WLR
Temperature compensated for use from -65°C to 300°C
fA/V level leakage measurements
Compatible with quick disconnect Celadon triax cable harnesses
Celadon produces probe cards and probing solutions for modeling & characterization, parametric test, and wafer level reliability for the semiconductor industry that thrive in any temperature extremes while still delivering accurate and precise test results.