Celadon has reduced the size of a probe card down so that it will fit on a conventional 3-hole mount probe positioner. You can switch from RF to DC test using the same probe holder. The design does not compromise performance, and is easily adjustable for a variety of wafer level reliability applications.
- Optimized for DC parametric test and WLR
- Temperature compensated for use from -65°C to 300°C
- fA/V level leakage measurements
- Compatible with quick disconnect Celadon triax cable harnesses
- Quasi-Kelvin connections available
- Several Connector options available