A history of ultra performance.
A legacy of ultra innovation.
Below is a brief glimpse of Celadon’s product innovations and industry firsts.
1997
- Celadon is founded by Bryan Root on February 15th
- First adjustable multi-site ceramic probe card on a 3 x 3 platform
1998
- Advanced Cantilever™ technology was invented and introduced to probe industry
- First low leakage ceramic probe card with operating temp range of -65 to 300C
- First multi-site ceramic probe card with operating temp range of -65 to 300C
- First low cost production ceramic probe card with self-aligning,
quickly replaceable individual probes - 72mm ceramic probe card
1999
- 114mm ceramic probe card
- 200mm ceramic probe card
2000
- T200 ButtonTile™ with Advanced Cantilever™ technology 200mm ceramic probe card
2001
- First 200mm “dead bug” probe card aligner
- T40™ ceramic probe card
2002
- First 300°C operating temperature coaxial probe – AttoFast™
2003
- T300 ButtonTile™ with Advanced Cantilever™ technology 300mm multi-site ceramic probe card
2005
- First 500°C ceramic probe card
- MiniTile™ with Advanced Cantilever™ technology probe
2006
- VersaTile™ with Advanced Cantilever™ technology ceramic probe card
2007
- T90™ with Advanced Cantilever™ technology multi-site ceramic probe card
2008
- First 300mm “dead bug” probe card aligner
2009
- VersaCore™ – first easy insertion twist lock probe card core
2010
- Introduced the 1×3 VersaTile™ with Advanced Cantilever™ technology multi-site probe card for 4.5″ probe card holders
2011
- Developed dual site 40mm parametric test probe card
- Awarded government research grant for high density multi-site wafer level reliability
2012
- Introduced Element Series VC20™ with Advanced Cantilever™ technology probe card for fast card changes in parametric test, modeling and characterization, and wafer level reliability testing.
2013
- Introduction of the Indexer™ – the industry’s first automatic probe card changer using the VC20™ with Advanced Cantilever™ technology probe cards.
2014
- VC43™ 100 pin channel modular probe card supporting 100 pin Parametric Testers
2015
- First cabled-out (triaxial and coaxial cables) VC20™ with Advanced Cantilever™ technology interface released
2016
- Diagnostic Probe Cards based on the VC20™ with Advanced Cantilever™ technology footprint
- More products to come this year!