Press Release

Webinar: Integrated Probe Card Solutions for Magnetic Testing

We invite you to join us for a webinar on Tuesday, August 25 at 1pm PDT/4pm EDT. We will discuss combining GMW’s expertise in Electromagnets & Magnetic Modeling with Celadon expertise in Probe Cards & Testing for complete integrated solutions compatible with all Probers. The fully integrated probe card is typically used for on-wafer parametric tests, modeling, characterization and wafer level reliability as well as functional tests.


Tom King, PhD

Lead Magnet Scientist
GMW Associates

Tom has an experimental physics background and has worked in the areas of laser physics, quantum computation and superconductivity. Since switching to commercial work, Tom has designed superconducting and copper magnets for industry applications. These include Hard Disk Drive testing systems, Ion implantation beam lines and MRAM test. Work with GMW started in 2006 and continues to the present.

Karen Armendariz

Celadon Systems

Karen Armendariz has over 25 years of experience in the semiconductor industry. Celadon Systems, Inc., is a US based industry leading on wafer probing solutions provider focused on the design and manufacturing of advanced probe card solutions, high performance cables and adaptors. Karen has held a variety of leadership positions throughout her career in manufacturing, engineering, and sales and marketing at Intel Corp., Cyrix, National Semiconductor, Creation Technologies and TEXSource, a leading manufacturer’s rep firm in the semiconductor industry. She holds a Bachelor’s Degree in Electrical Engineering from the University of Oklahoma and a Master’s in Business Administration from Oklahoma City University.

Bill Funk

Chief Technical Officer
Celadon Systems

Bill has enjoyed a life-long passion to design and build. With an Aerospace engineering degree from University of Minnesota, Bill worked the first half of his career with Beech Aircraft and Rosemount Aerospace. He then spent a few years doing factory automation and medical consulting. Bill finally joined Celadon Systems founder Bryan Root in his Basement, 20 years ago, to help build Celadon.

Electromagnet and Probe Station Integration

An example of the collaboration between GMW and Celadon System is the GMW 5207 Projected Field Electromagnet and Probe Station Integration to optimize the performance of the combined electromagnet and probe card.

  • 5207 Electromagnet with custom Magnetic Pole Extender integrated with a Celadon Non-Ferrous VersaCore™
  • Peak Field, Continuous (35A): >1.3T
  • Peak Field, Triangle (60A): >2T
  • Single device or 4 x 4mm whole array testing
  • Celadon cards are compatible with any probe station

Additional Information

We will be discussing this integration along with other capabilities of GMW Associates and Celadon Systems on Tuesday, August 25 at 1pm PDT/4pm EDT.

June 29, 2020

Celadon Systems, Inc., “The Home of Peace of Mind Probing”, has partnered with GMW Associates to develop an innovative integrated electro-magnet and probe card solution. Using this unique configuration device testing of a single DUT with magnetic fields up to 1.0 Tesla is possible and up to .85 Tesla can be applied to an array.

May 22, 2020

Celadon’s 3000V VersaJet™ System enables on-wafer probing from room temperature to 200C

Celadon Systems, Inc., the home of “Peace of Mind Probing”, has led the industry in high temperature on-wafer probing solutions for over 20 years. When it comes to high voltage testing, the key to success is arc suppression.

Celadon VersaJet™ System including the VersaJet™ Control Unit and Heater below

Celadon’s VC20EHV™ and 45EHV™

Celadon’s High Temperature, High Voltage solution consists of a VersaJet™ Controller and Heater, 45EHV 4.5inch Adaptor and VC20EHV Probe Card.

Celadon believes there isn’t a good reason for allowing hard break downs to occur when performing high voltage testing. Celadon’s high voltage team spent almost five years developing test wafers, test methodology, test equipment, and probe cards in an effort to reduce hard break downs. Several papers were presented at various conferences reviewing test technique and system performance. Click on the highlighted link to go to the papers:

Cascade (FFI) Compass User Group, “Achieving 3000V at the Wafer Level”
SW Test, “Forget the Paschen and Embrace Turbulence”

The system is based on the popular and modular high voltage version of the VC20E VersaCore™ probe card. With pattern changes, the engineer will only need to change the VC20EHV probe card core, the rest of the set up all stays in place. This results in hundreds of hours saved in set up time.

System Overview

Here is the link to the High Voltage Product Guide

The system can support up to twelve 3000 Volt channels and 32 fully isolated low leakage channels. Celadon uses a propriety insulative material which eliminates the risk of probe beam to wafer arcing.

The VC20EHV (high voltage probe card) and 45EHV (high voltage 4.5inch adaptor) are both required in the high temperature and room temperature setups. For a room temperature set up, Celadon offers a kit that includes a regulator with a display and house air interface. This setup can extend the breakdown voltage at room temperature 50% or more as shown in the graphs below.

For high temperature testing, the VersaJet™ Controller and Heater are required for arc suppression. The air lines and electricals coming from the VersaJet™ Controller run through the VersaJet™ Heater and then are snapped into the back of the VC20EHV probe card while mounted in the 45EHV adaptor. This air stream is temperature controllable by the VersaJet™ Heater. Matching the VersaJet™ air temperature to the chuck/wafer temperature helps maintain stable DUT temperature for more accurate measurements. This connection at the VC20EHV probe card includes a safety interlock as well as air supply and thermal feedback sensors.

The directed air coming from the cap that is snapped into the back of the VC20EHV disrupts the ionization path and produces a high pressure “air bubble” at the wafer surface. This “air bubble” prevents surface arcing or die to die arcing, which can extend the break down voltage up to 50% at temperature.

Installation Example:

Celadon’s VersaJet™ Installed in a rack, the VersaJet™ heater, 45EHV and VC20EHV installed in an auto-prober setup.

If you are challenged with on-wafer high voltage probing, please reach out to, we are happy to support you.

Celadon Systems, Inc., is a US based industry leading on-wafer probing solutions provider focused on the design and manufacturing of advanced probe card solutions and high-performance cables.


April 30, 2020

Celadon Cryogenic Probe Cards – Probing extremely small pads with and without a Prober at 4K

Celadon Systems, Inc., the home of “Peace of Mind Probing”, has been a critical supplier of advanced Cryogenic Probe Cards to Quantum Computing, Medical, Space and Military companies for over 20 years. These specialized cabled-out probe cards can be used down to 77K, 4K, or in some cases as cold as humanly possible.
Here are some examples:
Celadon’s Cryogenic VersaTile™

Celadon’s VersaTile™ has successfully probed at 6x9 micron test structure at 77K.
Celadon’s Cryogenic Tile-on-Card™

Celadon’s VersaTile™ and Tile-on-Card™ product families are compatible with most commercially available cryogenic probers. These cards were able to support 18 micron pitch.

Celadon has spent years researching and testing different materials to achieve stability over temperature at these extremely low temperatures. It is essential to find materials that are compatible and don’t compete with one another at temperature. If the Coefficient of Thermal Expansion (CTE) is too different between connecting parts on a probe card, cracking and breakage of part(s) can occur when going cold. When probe card materials’ CTE’s are not in equilibrium, one can expect a mess on their hands as materials can shatter at temperature.
Celadon invented the MobileProbe™ to support customers who have a cryo chamber but do not have a prober available to them.

The MobileProbe™ includes an integrated probe card which enables single die probing [post-dice]. This unit can support hundreds of probes. The MobileProbe™ enables testing at 4K. This technology is also designed to be capable of scaling to test multiple diced die, or even 4 inch and 6 inch wafers.
If you are challenged with probing at Cryogenic temperatures, please reach out to we are happy to support you.
Celadon Systems, Inc., is a US based industry leading on-wafer probing solutions provider focused on the design and manufacturing of advanced probe card solutions and high-performance cables.

Celadon Systems, Inc. provides business update on March 24, 2020

Friends and Colleagues,

We certainly hope you are all staying safe and well during the COVID 19 health crisis. As a critical supplier to many of you, please know our team is working hard to maintain business continuity. Our team implemented swift changes over the last two weeks to ensure our workforce is safe and healthy while adhering to the State and Federal mandates. Our support personnel and engineers are now working either full or part time from home. For now, Celadon is currently not accepting visitors on-site and our sales team will support our customers via teleconferences to keep our employees and customers healthy.

Celadon’s manufacturing team is up and running close to full capacity; the good news is we are building most product within our standard lead times.

In anticipation of a potential full shutdown should the state or community go into a two week full lock down and/or there is illness at the factory, Celadon would like to be proactive and work closely with our customers to ensure continuity. Please reach out to to work out a support plan. Celadon is dedicated to serve our customers and will do our best to support you during this critical time.

Kind regards,

Karen Armendariz

President and CEO

Phone: + 1 972 998 7091

Celadon Systems, Inc.

13795 Frontier Court

Burnsville, MN 55337-4874 USA

Celadon Systems, Inc. Selects Karen Armendariz as new President and CEO

Celadon Systems, Inc. announced today that its leadership team has unanimously approved Karen Armendariz as the company’s next chief executive officer and president. Armendariz, who currently serves as Celadon’s VP of Worldwide Sales, will succeed Bryan Root, the company’s founder and current CEO.

“I am honored to be carrying the Celadon torch leading an extraordinary team of people that live Celadon’s core values of Integrity, Invention, Innovation and Dedication every day,” said Armendariz. ”Celadon Systems, known for providing unrivaled lab to fab probe card solutions that thrive in extreme environments, has been instrumental in equipping the semiconductor industry with probing solutions to successfully release new and reliable products for over 20 years. Today, Celadon Systems is uniquely positioned, with the most robust probe cards available, to enable the semiconductor industry to significantly reduce cost of test in production. I am thrilled to be given the opportunity to lead this exceptional organization determined to operate with excellence and provide the industry with unparalleled, leading edge probing solutions. “

As a member of Celadon’s leadership team since she joined the company in 2013, Armendariz has played an integral role in the company’s growth and success.

Armendariz holds a Bachelor’s degree in Electrical Engineering from the University of Oklahoma and an MBA from Oklahoma City University. Prior to joining Celadon in 2013, her history in the semiconductor industry included positions in operations and engineering management, in addition to her extensive sales and marketing experience.

Root, who started Celadon in 1997 with his wife Valerie, expressed confidence in his choice, “Karen’s reputation of strong leadership is well-known both inside and outside of Celadon. Her commitment, together with her industry experience, customer focus and strategic vision, makes her uniquely qualified to lead Celadon successfully into the future.”

For inquiries, contact Jennifer Nichols, Director of Finance and Operations, at

Celadon Systems is a privately held, 23 year old, US based manufacturer known for providing “Peace of Mind” probing solutions to the semiconductor industry.

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Upcoming Trade Shows:

IEEE International Reliability Physics Symposium

Visit us at IRPS in Dallas, Texas

March 29 – April 2 2020

IEEE International Conference on Microelectronic Test Structures

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April 6 – April 9 2020

Expo Electronica

Moscow, Crocus Expo IEC Pavilion #3, Hall  #14

April 14 – 16 2020

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Semiconductor Wafer Test Workshop

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June 7 – 10 2020

Semiconductor Wafer Test Asia

Visit us at SWTWA in Hsinchu Taiwan R.O.C. (Sheraton Hsinchu Hotel)

October 15-16 2020

IEEE International Electron Devices Meeting

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December 14 – 16 2020

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