- Maximum channel count: 48
- Tester platforms: Keysight 4062, 4072, 4080, Keithley S600, S530, Rack and Stack configurations.
- Minimum Pad Size: 30ux30u (tunable scrub)
- Contact Resistance: less than 1 ohm
- Temperature range: -65C to 200C
- Leakage: Less than 5 femto Amps per volt. If you require faster settling time, click here
- Repairable
- Lifetime Performance: Production customers are experiencing 10M+ million touchdowns on Aluminum and Copper pads. Few to no rebuilds due to pobe wear
VC20TM with Advanced CantileverTM technology Lead Times:
- Production Reorder: 1 – 2 weeks
- Rebuilds: 1 – 2 weeks
- New Order: 2 – 3 weeks after design approval

Modular
universal motherboards

Fast changeover time
insertion tool

Or automated
Indexer TM can support up to five VC20 TM with Advanced CantileverTM technology cores

Customizable PCB
Integrated into VC20 TM with Advanced CantileverTM technology Probecard to support
resistor IDs, capacitors, inductors, EEProms
only 12mm from probe tips
The VersaCore TM is also used to do reliability testing as well as modeling and characterization.
952-232-1700
Celadon News:
Celadon exhibited and presented a technical paper at Semiconductor Wafer Test Workshop 2016
Celadon exhibited at the International Reliability and Physics Symposium 2016
Upcoming Trade Shows:
Celadon will be exhibiting at Compass Cascade User Group in Portland, Oregon October 17th and 18th. Learn more
Celadon will be exhibiting at the IEEE International Electron Devices Meeting in San Francisco, California December 5th-7th Learn more
Celadon will be presenting at the International Reliability Physics Symposium in Monterrey, California, April 2-4 in 2017 Learn more