production parametric probe card

Through the use of factory automation and proprietary processes and equipment, Celadon has set a new industry standard for probe card robustness, low leakage and lifetime performance with the VC20TM  with Advanced CantileverTM technology probe card.


  • Maximum channel count:  48
  • Tester platforms:  Keysight 4062, 4072, 4080, Keithley S600, S530, Rack and Stack configurations.
  • Minimum Pad Size:  30ux30u (tunable scrub)
  • Contact Resistance:  less than 1 ohm
  • Temperature range:  -65C to 200C
  • Leakage:  Less than 5 femto Amps per volt. If you require faster settling time, click here
  • Repairable
  • Lifetime Performance: Production customers are experiencing 10M+ million touchdowns on Aluminum and Copper pads. Few to no rebuilds due to pobe wear

VC20TM with Advanced CantileverTM technology Lead Times:

  • Production Reorder:  1 – 2 weeks
  • Rebuilds:  1 – 2 weeks
  • New Order:  2 – 3 weeks after design approval


Interchangeable probe card,
universal motherboards

Fast changeover time

from one probe card to the next using an
insertion tool

Or automated

Indexer TM can support up to five VC20 TM with Advanced CantileverTM technology cores

watch video Technical Paper

Customizable PCB

Integrated into VC20 TM  with Advanced CantileverTM technology Probecard to support
resistor IDs, capacitors, inductors, EEProms
only 12mm from probe tips

Based on your pad material, Celadon will make cleaning media recommendations

The VersaCore TM is also used to do reliability testing as well as modeling and characterization.

Core Values

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