Extreme Temperature Testing

Cryo to 600°C

Celadon is the industry leader in over temperature measurements. Celadon’s probe cards can thrive in any temperature extremes from 7 Kelvin to 600C. Watch what happens when a Celadon T40™ probe card is grilled! Don’t try this with any other vendor’s probe card.

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Off-line Cleaning of Celadon’s Robust Probe Cards

Due to Celadon’s patented ceramic Crash Resistant Technology™, Celadon’s probe cards are extremely rugged, so much so, you can even clean them using a toothbrush. Check out this video on how to do so. Please don’t try this with any other probe card.

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Crash Resistant

Be Ready With Celadon

This video demonstrates how robust the Celadon probe card is during a typical “crash”. Watch what happens when the Celadon probe card and a Blade card are crashed into a wafer.

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Innovative Engineering

Two of Celadon’s core values are invention and innovation which are exemplified in the Indexer™. The Indexer™ is the industry’s first Automatic Probe Card Changer using Celadon’s VC20™ with Advanced Cantilever™ technology parametric probe cards. Take a look at the video and technical paper presented at SW Test in 2013.

Technical Paper

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T40™ Series Probe Card

Ultra low noise and fast settling modeling and characterization tests are made possible by Celadon’s patented ceramic probe cards.

T40™LL, T40™HT, T40™AF, T40™LLIC, T40™AFIC

The 40 mm tile was designed for mounting on a standard 4.5″ probe card holder. The 1.6 mm (0.062″) thick rails allow the chassis to slip into planarity adjustable probe card holders for most analytical probe stations.

  • 40 millimeter ceramic probe card
  • Optimized for DC parametric test and single site WLR
  • Compatible with standard 4.5″ rectangular edge card holders
  • Temperature compensated for use from-65°C to 300°C
  • Extended temperature option to 600°C
  • Sub-fA level leakage measurements available
  • Compatible with quick disconnect triaxial cable harnesses
  • Quasi-Kelvin connections available
  • Several connector options available

Download Data Sheet

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Minitile™ with Advanced Cantilever™ technology and WedgeTile™

Each probe is designed for wide temperature ranges and so the probe expansion characteristics are closely matched to the wafer’s expansion characteristics. This allows the user to take a fast measurement while a system is in a settling or thermal stabilization mode and helps compensate for wafer expansion.

  • Rigid ceramic and metal chassis
  • Integrated cable strain reliefs
  • -65°C to 300°C operating temperature ranges
  • 1 to 25 pins per site
  • Available in regular low leakage (5 femto amps per volt)
  • AttoFast™ with guarded tips for 2 femto amp per volt settling time
  • High accuracy capacitance measurements
  • Low probe to probe capacitance for high accuracy CV measurements and for device characterization and modeling

Download Data Sheet

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T90™ with Advanced Cantilever™ technology Series Probe Card

The 90 mm tile was designed for mounting on a standard 4.5″ probe card holder for multi-site wafer level reliability testing. The 1.6 mm (0.062″) thick rails allow the chassis to slip into planarity adjustable probe card holders for most analytical probe stations.

  • 90 millimeter ceramic probe card
  • Optimized for multi-site DC parametric test and multi-site WLR
  • Compatible with standard 4.5″ rectangular edge card holders
  • Temperature compensated for use from -65°C to 300°C
  • fA level leakage measurements
  • Compatible with quick disconnect Celadon triax cable harnesses
  • Quasi-Kelvin connections available
  • Several Connector options available

Download Data Sheet

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VersaTile™ with Advanced Cantilever™ technology

Celadon has reduced the size of a probe card to 28mm with the VersaTile™ with Advanced Cantilever™ technology. The VersaTile™ with Advanced Cantilever™ technology can fit on a conventional 3-hole mount probe positioner for single site probing. The same VersaTile™ with Advanced Cantilever™ technology can be used in a 300mm VersaPlate™ for multi-site probing.

  • Optimized for DC parametric test and WLR
  • Temperature compensated for use from -65°C to 300°C
  • fA/V level leakage measurements
  • Compatible with quick disconnect Celadon triax cable harnesses
  • Quasi-Kelvin connections available
  • Several Connector options available

Download Data Sheet

If interested in a fully-integrated high-throughput test cell for wafer-level reliability (WLR), the Cascade Microtech ESTRADA system using Celadon probe cards may be a good fit for your testing needs.”  Click here to learn more. 
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High Performance Cables and Accessories

Quietest cables in the Industry. Get the most out of your probe card.

Cables are designed and manufactured by Celadon. Cables are available in lengths custom to the half-meter, and can be manufactured with a variety of industry standard connectors, such as coaxial, triaxial, Type8, Edge 24/48 or 35/70, DSub 9, 15, 25, or 50; or advanced multi-contact. Depending on the overall size of the final product, an anti-abrasion sheath may be used to prevent wire wear.

  • Low noise/low triboelectric effect
  • Low leakage/isolation between signal and guard
  • Low guard to shield capacitance/minimize load on guard amp
  • Strong to minimize damage/should be clamped or held
  • All cable systems are manufactured to perform to the highest standards of ultra-low noise so that you can obtain the most accurate results possible.

Download Data Sheet

Light Tight Enclosure

The Celadon Octagon Light Tight Enclosure surrounds the probe card to guarantee maximum low-level current monitoring performance.

  • Removable side panels allow for customization of the cabling connection.
  • 25-pin AMP connectors allow quick connect and disconnect of the low leakage driven guard channels
  • A removable lid completes the light tight design

Modular Adapters

Rigid and stable probe card holder for T200™, T300™, and VersaTile™ with Advanced Cantilever™ technology/VersaPlate™. Also Compatible with T40™, T90™ with Advanced Cantilever™ technology, and special probe cards. Temperature Stable to 400°C. Three point planarity adjustment. Compatible with the Cascade Elite, Accretech UF3000, TEL P12, and other probers. Also designed for high Z force multi-site probing applications.

Modular Adaptor Ring

  • High stability
  • Designed for correct probe card heights
  • Allows use of full range of Celadon ceramic probe cards such as T40™, T90™ with Advanced Cantilever™ technology, T200™ and T300™
  • Has insert rings to hold various types of Celadon probe cards, which allows for rapid probe card changes
  • Theta change does not cause x-y shift, reducing setup time via central axis pivot action
  • Transportable from one prober to another with personality rings
  • Allows probe stations to use high pin count probe cards due to superior strength and rigidity (prober requires chuck with minimal tilt for given applied Z force)
  • Designed for thermal probing applications with materials that will hold up to wide temperature variations
  • Has high Z force planarity adjustments required by multi-site probe cards
  • Allows probe cards to be rotated so if wafer orientation changes, you do not have to purchase another probe card

Cascade Microtech (Aetrium) Package Interface

  • Turns any Cascade Microtech (Aetrium) package tester into a wafer level or package tester
  • Interface boards available for all Cascade Microtech (Aetrium) application modules