2025 CORE Users’ Group Hsinchu, Taiwan March 4th, 2025 Keynote: Increasing Role of Probe from Lab to Fab: Data Integrity in Semiconductor Testing Session 1: Increase Data Collection Exponentially with Proven WLR Fixed, Adjustable and Automated Solutions Session 2: Exceptionally Stable Production Parametric Solutions Session 3: Novel High-Power Applications on Si and GaN Session 4: Cryogenic Probing Solutions down to 2K Session 5: Intriguing on-wafer probe applications: MRAM, Photonics Integrated Circuits (PIC), and ESD Probe Card Cleaning Tutorial
