Celadon Systems, Inc.’s business, products, and processes are protected by U.S. and International patents and pending U.S. and International patent applications. The issued patents include:
US 6201402 13-Mar-2001
PROBE TILE AND PLATFORM FOR LARGE AREA WAFER PROBING
JP 3287800 15-Mar-2002
PROBE TILE AND PLATFORM FOR LARGE AREA WAFER PROBING
US 6586954 01-Jul-2003
PROBE TILE AND PLATFORM FOR LARGE AREA WAFER PROBING
TW I226096 01-Jan-2005
PROBE PLATFORM AND METHOD FOR ELECTRICALLY PROBING SEMICONDUCTOR WAFERS
US 6882168 19-Apr-2005
PROBE TILE FOR PROBING SEMICONDUCTOR WAFER
US 6975128 13-Dec-2005
ELECTRICAL, HIGH TEMPERATURE TEST PROBE WITH CONDUCTIVE DRIVEN GUARD
US 6992495 31-Jan-2006
SHIELDED PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER
US 7148710 12-Dec-2006
PROBE TILE FOR PROBING SEMICONDUCTOR WAFER
US 7170305 30-Jan-2007
APPARATUS AND METHOD FOR TERMINATING PROBE APPARATUS OF SEMICONDUCTOR WAFER
US 7259577 21-Aug-2007
SHIELDED PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER
US 7271607 18-Sep-2007
ELECTRICAL, HIGH TEMPERATURE TEST PROBE WITH CONDUCTIVE DRIVEN GUARD
US 7345494 18-Mar-2008
PROBE TILE FOR PROBING SEMICONDUCTOR WAFER
CN 03152461.3 22-Apr-2009
SHIELDED PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER
US 7545157 09-Jun-2009
SHIELDED PROBE APPARATUS FOR PROBING SEMINCONDUCTOR WAFER
US 7626404 01-Dec-2009
REPLACEABLE PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER
TW I318300 11-Dec-2009
SHIELDED PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER
US 7659737 09-Feb-2010
ELECTRICAL, HIGH TEMPERATURE TEST PROBE WITH CONDUCTIVE DRIVEN GUARD
US 7728609 01-Jun-2010
REPLACEABLE PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER
TW I327226 11-Jul-2010
SHIELDED PROBE APPARATUS
EM 001225460-0001 19-Jul-2010
GROOVED WIRE SUPPORT FOR A PROBE TEST CORE
EM 001225460-0002 19-Jul-2010
TOP CONTACT LAYOUT FOR A MOTHERBOARD IN AN ELECTRICAL SYSTEM
US 7768282 03-Aug-2010
APPARATUS AND METHOD FOR TERMINATING PROBE APPARATUS OF SEMICONDUCTOR WAFER
US 7786743 31-Aug-2010
PROBE TILE FOR PROBING SEMICONDUCTOR WAFER
CN 200580034397.5 01-Jun-2011
REPLACEABLE PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER
US 7956629 07-Jun-2011
PROBE TILE FOR PROBING SEMICONDUCTOR WAFER
US D639755 14-Jun-2011
TOP CONTACT LAYOUT FOR A MOTHERBOARD IN AN ELECTRICAL SYSTEM
US D639757 14-Jun-2011
TOP CONTACT LAYOUT BOARD IN AN ELECTRICAL SYSTEM
US 7999564 16-Aug-2011
REPLACEABLE PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER
US D654033 14-Feb-2012
GROOVED WIRE SUPPORT FOR A PROBE TEST CORE
US 8149009 03-Apr-2012
APPARATUS AND METHOD FOR TERMINATING PROBE APPARATUS OF SEMICONDUCTOR WAFER
CN 200810214776.8 20-Jun-2012
REPLACEABLE PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER
US 8354856 15-Jan-2013
REPLACEABLE PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER
TW I391689 01-Apr-2013
REPLACEABLE PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER
TW I408374 11-Sep-2013
APPARATUS AND METHOD FOR TERMINATING PROBE APPARATUS OF SEMICONDUCTOR WAFER
US 8674715 18-Mar-2014
TEST APPARATUS HAVING A PROBE CORE WITH A TWIST LOCK MECHANISM
TW I431281 21-Mar-2014
REPLACEABLE PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER
CN 201110099921.4 02-Apr-2014
REPLACEABLE PROBE APPARATUS FOR PROBING SEMICONDUCTOR WAFER
US 8698515 15-Apr-2014
PROBE TEST EQUIPMENT FOR TESTING A SEMICONDUCTOR DEVICE
US D713363 16-Sep-2014
SUPPORT FOR A PROBE TEST CORE
US 8860450 14-Oct-2014
APPARATUS AND METHOD FOR TERMINATING PROBE APPARATUS OF SEMICONDUCTOR WAFER
US D722031 03-Feb-2015
TOP CONTACT LAYOUT BOARD IN AN ELECTRICAL SYSTEM
US 8994390 31-Mar-2015
TEST SYSTEMS WITH A PROBE APPARATUS AND INDEX MECHANISM
US 9018966 28-Apr-2015
TEST APPARATUS HAVING A PROBE CARD AND CONNECTOR MECHANISM
US 9024651 05-May-2015
TEST APPARATUS HAVING A PROBE CARD AND CONNECTOR MECHANISM
CN 201280039075.X 15-Jul-2015
TEST APPARATUS HAVING A PROBE CARD AND CONNECTOR MECHANISM
TW I503551 11-Oct-2015
APPARATUS AND METHOD FOR TERMINATING PROBE APPARATUS OF SEMICONDUCTOR WAFER
US 9279829 08-Mar-2016
APPARATUS AND METHOD FOR TERMINATING PROBE APPARATUS OF SEMICONDUCTOR WAFER
CN 201280042127.9 06-Jul-2016
TEST APPARATUS HAVING A PROBE CARD AND CONNECTOR MECHANISM
TW I570413 11-Feb-2017
TEST APPARATUS HAVING A PROBE CARD AND CONNECTOR MECHANISM
TW I570417 11-Feb-2017
TEST APPARATUS HAVING A PROBE CARD AND CONNECTOR MECHANISM
CN 201280041706.1 15-Feb-2017
TEST SYSTEMS WITH A PROBE APPARATUS AND INDEX MECHANISM
TW I572872 01-Mar-2017
TEST APPARATUS HAVING A PROBE CARD AND CONNECTOR MECHANISM
US 9678149 13-Jun-2017
TEST APPARATUS HAVING A PROBE CORE WITH A TWIST LOCK MECHANISM
US 9726694 08-Aug-2017
TEST SYSTEMS WITH A PROBE APPARATUS AND INDEX MECHANISM
