We’re pleased to announce that Celadon was a recipient of a NIST (National Institute of Standards and Technology) research grant to study means of accurately conducting high-temperature-and-volume WLR tests as wafers continue to get smaller and smaller. The past ten years have seen incredible growth and innovation in the semiconductor industry, and we’re excited that with this grant, we have an opportunity to make sure the innovation of semiconductor testing keeps pace with an improved method of performing wafer level reliability tests. If you have any questions or comments, please feel free to get in touch with Joe at joe@celadonsystems.com.