Ultra High Performance Probe Cards

Highlights

The VersaCore™ The industry’s lowest cost-per-touchdown parametric probe card delivers ultra low leakage measurements, wide operating temperature range, ultra high performance, and infinite rebuilds…[+]

T40™ Series Probe Card The T40™ is the industry’s most versatile probe card – probe ultra high temperatures and ultra low temperatures, from -65°C to 400°C…[+]

MiniTile Probe Wafer level reliability testing can be easily customized for multi-site testing on various wafer layouts and designs… [+]

Products

The Element Series Use the same 20mm VC20 probe card in a variety of snap-install interfaces for modeling and characterization, wafer level reliability, and production parametric test… [+]

Modeling and Characterization Low leakage and low noise probe cards deliver accurate data… [+]

Wafer Level Reliability Probe cards designed for high density multi-site wafer level reliability testing that’s fast and accurate… [+]

Parametric Test Low leakage data with the lowest-cost-per-touchdown parametric test probe card for Agilent and Keithley testers… [+]

About Us

Celadon’s History Since 1997, Celadon has forged a rich history of developing ultra high performance probe card technology… [+]

The Celadon Technology Difference Patented ceramic technology is at the core of our ultra low leakage and ultra high temperature probe cards… [+]

Frequently Asked Questions Common questions about our probe cards for wafer level reliability, parametric test, and modeling & characterization… [+]