Ultra High Performance Probe Cards
Introducing the Element Series The ultra-high performance VC20 20mm VersaCore™ probe card for modeling and characterization, wafer level reliability, and production parametric test...
Ultra High Performance Celadon is the world's premier designer & manufacturer of ultra high performance probe cards and probing solutions for the semiconductor industry.
Modeling & Characterization Probe cards made with Celadon's patented ceramic technology perform in a wide temperature range, are crash resistant, ultra low leakage, ultra low noise, and fast settling.
Wafer Level Reliability Explore Celadon's variety of ceramic probe cards designed for multi-site wafer level reliability testing.
Parametric Test Fast settling, ultra low noise measurements, and the lowest cost per touchdown parametric test probe card for the semiconductor industry.
Patented Technology Celadon's patented core technology of ceramic based probing solutions delivers the best results for semiconductor testing in modeling & characterization, parametric test, and wafer level reliability.
Fireworks To celebrate the 4th of July at the office, we staged an explosive test with a T40 Series™ probe card.
Highlights
The VersaCore™ The industry’s lowest cost-per-touchdown parametric probe card delivers ultra low leakage measurements, wide operating temperature range, ultra high performance, and infinite rebuilds…[+]
T40™ Series Probe Card The T40™ is the industry’s most versatile probe card – probe ultra high temperatures and ultra low temperatures, from -65°C to 400°C…[+]
MiniTile Probe Wafer level reliability testing can be easily customized for multi-site testing on various wafer layouts and designs… [+]
Products
The Element Series Use the same 20mm VC20 probe card in a variety of snap-install interfaces for modeling and characterization, wafer level reliability, and production parametric test… [+]
Modeling and Characterization Low leakage and low noise probe cards deliver accurate data… [+]
Wafer Level Reliability Probe cards designed for high density multi-site wafer level reliability testing that’s fast and accurate… [+]
Parametric Test Low leakage data with the lowest-cost-per-touchdown parametric test probe card for Agilent and Keithley testers… [+]
About Us
Celadon’s History Since 1997, Celadon has forged a rich history of developing ultra high performance probe card technology… [+]
The Celadon Technology Difference Patented ceramic technology is at the core of our ultra low leakage and ultra high temperature probe cards… [+]
Frequently Asked Questions Common questions about our probe cards for wafer level reliability, parametric test, and modeling & characterization… [+]
