hiperlink here
VC20E™ Series Probe Card
The 20mm VC20™ with Advanced Cantilever™ technology is a highly adaptable probe card solution for a wide variety of tests including Modeling & Characterization, Wafer Level Reliability or Parametric Test. It can be easily combined with different interfaces to create modular probe cards supporting Keithley, Keysight or other custom tester platforms.
  • 20 millimeter ceramic probe card
  • Optimized for DC parametric test, modeling and characterization, and single site WLR
  • Can be quickly installed using an interface tool into various interfaces and takes minimal storage space on the test floor
  • Effective operating temperature range from -65° to 200° C
  • Leakage as low as 5fA/V. If you require faster settling time, click here
  • Can be configured with up to 48 probes
  • Probes can be configured in either single or dual layer
  • Standard X/Y accuracy 10% pad size
  • Standard Z accuracy +/- 5 microns

Download Data Sheet

Interested in Production Parametric Probe?

I am here
Indexer™
The patented Indexer™ is the industry’s first automatic probe card changer designed for lights out parametric test.

  • Can support up to five VC20™’s with Advanced Cantilever™ technology, any variety
  • Card changes are complete in seconds
  • Fully programmable
  • Tested for hundreds of thousands of touchdowns.

Download Data Sheet

I am here
Air Ready Indexer

The Air Ready Indexer has all of the features as the standard Indexer with the addition of the option of customer added CDA at the probe card

Download Data Sheet

I am here
Diagnostic VersaCore™
The diagnostic cores are uniquely designed in the VC20™ with Advanced Cantilever™ technology format. Using the customizable PCB, components can be added to create a “golden core” to quickly troubleshoot your system

  • Test SMUs
  • Test Motherboard
  • Test Pogo pins
  • Test Relay matrix
I am here

VC43™/VC43EAF™

VC43™/VC43EAF™ PROBE CARDS OFFER A LARGER FORMAT VERSION OF THE POPULAR VC20™

The VC43™ Element Series probe card is modular and can be quickly and easily installed into a variety of industry compatible probing platforms including: MPPT, Verigy, P9000 or other custom solutions including cabled-out interfaces.

In addition to saving time, another advantage of the modularity is the ability to leave the interface in place and simply install the VC43™ topside using Celadon’s twist and lock insertion tool which minimizes the possibility of triboelectric or interconnect issues that can occur during typical probe card changes. The VC43™ can be used for production parametric test, modeling, characterization, and wafer level reliability testing. Cards can be configured up to 104 probes in either single or dual layer with near vertical probes to minimize scrub lengths on pads allowing the VC43s to probe pads as small as 30 microns.

Celadon’s proven AttoFast™ technology has been integrated into the VC43™ probe card resulting in superior leakage performance, low and more stable capacitance while retaining the flexibility of a modular probe card system. The VC43EAF is an option offered as a sister product to the VC43™. Both designs of the VC43 are compatible with direct dock Parametric Testers and with cabled out solutions to support rack and stack testing.

  • 43 millimeter ceramic probe card
  • Optimized for DC parametric test, modeling and characterization, and single site WLR
  • Can be quickly installed using an interface tool into various interfaces and takes minimal storage space on the test floor
  • Effective operating temperature range from -65° to 200°C
  • Leakage as low as 5fA/V
  • Can be configured with up to 100 probes
  • Probes can be configured in either single or dual layer
  • Repairable
I am here

T40™ Series Probe Card

Ultra low noise and fast settling modeling and characterization tests are made possible by Celadon’s patented ceramic probe cards.

T40™LL, T40™HT, T40™AF, T40™LLIC, T40™AFIC

The 40 mm tile was designed for mounting on a standard 4.5″ probe card holder. The 1.6 mm (0.062″) thick rails allow the chassis to slip into planarity adjustable probe card holders for most analytical probe stations.

  • 40 millimeter ceramic probe card
  • Optimized for DC parametric test and single site WLR
  • Compatible with standard 4.5″ rectangular edge card holders
  • Temperature compensated for use from-65°C to 300°C
  • Extended temperature option to 600°C
  • Sub-fA level leakage measurements available
  • Compatible with quick disconnect triaxial cable harnesses
  • Quasi-Kelvin connections available
  • Several connector options available

Download Data Sheet

I am here

Minitile™ with Advanced Cantilever™ technology and WedgeTile™

Each probe is designed for wide temperature ranges and so the probe expansion characteristics are closely matched to the wafer’s expansion characteristics. This allows the user to take a fast measurement while a system is in a settling or thermal stabilization mode and helps compensate for wafer expansion.

  • Rigid ceramic and metal chassis
  • Integrated cable strain reliefs
  • -65°C to 300°C operating temperature ranges
  • 1 to 25 pins per site
  • Available in regular low leakage (5 femto amps per volt)
  • AttoFast™ with guarded tips for 2 femto amp per volt settling time
  • High accuracy capacitance measurements
  • Low probe to probe capacitance for high accuracy CV measurements and for device characterization and modeling

Download Data Sheet

I am here

T90™ with Advanced Cantilever™ technology Series Probe Card

The 90 mm tile was designed for mounting on a standard 4.5″ probe card holder for multi-site wafer level reliability testing. The 1.6 mm (0.062″) thick rails allow the chassis to slip into planarity adjustable probe card holders for most analytical probe stations.

  • 90 millimeter ceramic probe card
  • Optimized for multi-site DC parametric test and multi-site WLR
  • Compatible with standard 4.5″ rectangular edge card holders
  • Temperature compensated for use from -65°C to 300°C
  • fA level leakage measurements
  • Compatible with quick disconnect Celadon triax cable harnesses
  • Quasi-Kelvin connections available
  • Several Connector options available

Download Data Sheet

I am here

Patch Panels

For maximum channel flexibility, Celadon can design and build custom patch panels to meet your WLR requirements.
I am here

VersaTile™ with Advanced Cantilever™ technology and VersaAdjust™

Celadon has reduced the size of a probe card to 28mm with the VersaTile™ with Advanced Cantilever™ technology. The VersaTile™ with Advanced Cantilever™ technology can fit on a conventional 3-hole mount probe positioner for single site probing. The same VersaTile™ with Advanced Cantilever™ technology can be used in a 300mm VersaPlate™ for multi-site probing.

  • Optimized for DC parametric test and WLR
  • Temperature compensated for use from -65°C to 300°C
  • fA/V level leakage measurements
  • Compatible with quick disconnect Celadon triax cable harnesses
  • Quasi-Kelvin connections available
  • Several Connector options available

Download Data Sheet

If interested in a fully-integrated high-throughput test cell for wafer-level reliability (WLR), the Cascade Microtech ESTRADA system using Celadon probe cards may be a good fit for your testing needs.”  Click here to learn more. 
I am here
Cryogenic 4K Probe Cards
Over the last 20 years the Celadon Engineering team has developed an expertise in cryogenic materials which has resulted in a solid reputation in the industry for producing extremely stable cryogenic on-wafer probe cards as well as DUT probing solutions. These Cryogenic probe cards have all the benefits of Celadon’s Crash Resistant™ probe technology but with the ability to probe as cold as humanly possible. Celadon’s cryogenic solutions vary from standard VersaTile™ footprints which interface to positioners to innovate custom PCB based designs to allow for flexibility when testing at these very cold temperatures. Lakeshore cryogenic wire is used in standard DC solutions for high density cable-out designs to support high pin count applications. During the development process, Celadon works closely with the cryogenic prober vendor to ensure the integrated solution is optimized for current and future testing needs.
This probe card has all of the benefits of the patented Crash Resistant Technology™ but with the ability to probe down to absolute cold.

Please contact the factory at 952-232-1700 for more information.

I am here
High Performance Cables and Accessories
Quietest cables in the Industry. Get the most out of your probe card.

Cables are designed and manufactured by Celadon. Cables are available in lengths custom to the half-meter, and can be manufactured with a variety of industry standard connectors, such as coaxial, triaxial, Type8, Edge 24/48 or 35/70, DSub 9, 15, 25, or 50; or advanced multi-contact. Depending on the overall size of the final product, an anti-abrasion sheath may be used to prevent wire wear.

  • Low noise/low triboelectric effect
  • Low leakage/isolation between signal and guard
  • Low guard to shield capacitance/minimize load on guard amp
  • Strong to minimize damage/should be clamped or held
  • All cable systems are manufactured to perform to the highest standards of ultra-low noise so that you can obtain the most accurate results possible.

Download Data Sheet

Light Tight Enclosure

The Celadon Octagon Light Tight Enclosure surrounds the probe card to guarantee maximum low-level current monitoring performance.

  • Removable side panels allow for customization of the cabling connection.
  • 25-pin AMP connectors allow quick connect and disconnect of the low leakage driven guard channels
  • A removable lid completes the light tight design

Modular Adapters

Rigid and stable probe card holder for T200™, T300™, and VersaTile™ with Advanced Cantilever™ technology/VersaPlate™. Also Compatible with T40™, T90™ with Advanced Cantilever™ technology, and special probe cards. Temperature Stable to 400°C. Three point planarity adjustment. Compatible with the Cascade Elite, Accretech UF3000, TEL P12, and other probers. Also designed for high Z force multi-site probing applications.

Modular Adaptor Ring

  • High stability
  • Designed for correct probe card heights
  • Allows use of full range of Celadon ceramic probe cards such as T40™, T90™ with Advanced Cantilever™ technology, T200™ and T300™
  • Has insert rings to hold various types of Celadon probe cards, which allows for rapid probe card changes
  • Theta change does not cause x-y shift, reducing setup time via central axis pivot action
  • Transportable from one prober to another with personality rings
  • Allows probe stations to use high pin count probe cards due to superior strength and rigidity (prober requires chuck with minimal tilt for given applied Z force)
  • Designed for thermal probing applications with materials that will hold up to wide temperature variations
  • Has high Z force planarity adjustments required by multi-site probe cards
  • Allows probe cards to be rotated so if wafer orientation changes, you do not have to purchase another probe card

Cascade Microtech (Aetrium) Package Interface

  • Turns any Cascade Microtech (Aetrium) package tester into a wafer level or package tester
  • Interface boards available for all Cascade Microtech (Aetrium) application modules
I am here

T300 ButtonTile™  with Advanced Cantilever™ technology Multisite Probe Card

The Celadon T300™ probe cards are designed for long-term, multi-site, high-density wafer level reliability or burn-in tests up to 400°C. In today’s economic environment, conventional reliability data is needed quickly while eliminating the cost, electrical stress, and delay of parts packaging while maintaining a wafer performance map.

  • 300 millimeter ceramic button probe card
  • Optimized for multi-site WLR
  • For use with the Celadon Modular Adapter™
  • Temperature compensated for use from -65°C to 350°C (options to 400°C)
  • fA level leakage measurements
 

Download Data Sheet

 

If interested in a fully-integrated high-throughput test cell for wafer-level reliability (WLR), the Cascade Microtech ESTRADA system using Celadon probe cards may be a good fit for your testing needs.”  Click here to learn more. 

I am here

Adjustable Multisite Rail System™

The Celadon Rail System allows multi-site testing capability with flexible die to die spacing using existing Celadon VersaTiles™ to minimize cost of test with new DUT structures. The modular design allows for additional site assemblies and rail assemblies to be added after the original system purchase. With the Celadon Light-Tight Enclosure and Rail System Tool, high accuracy alignment and testing can be performed at extreme temperatures without affecting the thermal equilibrium of the system.

 

Download Data Sheet

 

Tile-on-Card™

Celadon’s uniquely robust and repairable patented probe-in-ceramic crash resistant probe cards reduce maintenance headaches while increasing tester utilization. Celadon’s TOC™ probe cards are known for achieving 10 million+ touch downs before rebuild on test floors worldwide.

The Celadon Tile-on-Card™ probe card is a low cost solution for lower temperature or ambient Device Testing, Modeling & Characterization or Wafer Level Reliability.

  • Has all of the benefits of the Celadon patented Crash Resistant Ceramic Technology
  • Is known for very low maintenance, having a long life resulting in a low cost of ownership
  • Can support multi-die testing up to 200 probes
  • Can support various tester platform

Download Data Sheet

Have a question? Need additional information?

Please call or email us:

Phone: 952-232-1700