Celadon System's Products

All of our probe cards are based on patented ceramic probing technology with crash resistant cantilever design. We combine the best materials with ultra high performance cabling systems to connect our probes to your probing station and precision instruments.

Parametric Test

You require the best price and performance, lowest cost per touchdown, fast and easy to repair, small size, and crash resistance. Our new VersaCore™ is the price and performance leader.

Modeling and Characterization

You require a probe card that can work with a small pad sizes and has a wide operating temperature range, a rigid design to last a long time, and unbeatable worry free electrical performance. Most of the world’s leading semiconductor companies in the world use Celadon T40 and VersaTile™ ultra high performance ceramic probe cards for device modeling and characterization.

Wafer Level Reliability

You require low leakage, high temperature, multi-site, crash resistance. Several applications include oxide reliability, transistor reliability and interconnect reliability. Traditional packaged part reliability is not possible for many advanced process technologies, is becoming increasingly costly and adds huge delays to process development cycles.